Microelectronics Reliability

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Microelectronics Reliability

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Issue DateTitleAuthor(s)
16-Jan-2017Formation of Cu6Sn5 phase by cold homogenization in nanocrystalline Cu-Sn bilayers at room temperatureH. Zaka; S.S. Shenouda ; S.S.Fouad ; M. Medhat; G. L. Katona; A. Csik; G. A. Langer; D. L. Beke