Statistics: 2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics, AOM 2010

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ID: 182721 - Refractive index change in porous silicon after detaching from the substrate	23
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	Jan	Feb	Mar	Apr	May	Jun	Jul	Aug	Sep	Oct	Nov	Dec	Tot
2021	0	0	0	0	0	0	0	0	0	0	2	0	2
2022	2	0	1	0	0	0	1	0	0	0	0	2	6
2023	0	1	0	1	0	1	1	1	1	0	1	3	10
2024	1	1	0	1	0	0	2	0	0	0	0	0	5
Ever													23