Statistics: 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

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ID: 197161 - A top-down approach for substrate noise assessment flow in mixed-signal and SOC designs	18
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	Jan	Feb	Mar	Apr	May	Jun	Jul	Aug	Sep	Oct	Nov	Dec	Tot
2021	0	0	0	0	0	0	0	0	0	0	2	2	4
2022	0	0	2	0	0	0	1	0	0	1	0	2	6
2023	0	0	0	0	0	0	0	1	1	0	0	1	3
2024	1	0	0	3	1	0	0	0	0	0	0	0	5
Ever													18