Structural characterization and physical properties of ternary Se75Te25-xGex thin films A Thesis Submitted To University Collage of Women for Arts, Science and Education - Ain Shams University

Abstract

Se75Te25-xGex(0 ≤ x ≤ 8) bulk materials was firstly prepared from the constituent elements in the stoishiometric proportions in evacuated silica tubes using laser deposition technique the prepared bulk ingot materials were characterized by means of X-ray differaction, [XRD] depicts the absence of any sharp diffraction peaks within the investigated“2θ” range, which confirms the expected amorphous nature of the prepared powdery compositions. Pulsed laser deposition technique was used for preparation of Se75Te25-xGex(0 ≤ x ≤ 8) thin films. high power femto-second laser [Titanium Sapphire] ~ Coherent US ~ with a wavelength of 800 nm and pulse duration of 30 fs delivered an average power of 700 m watt. The laser was operated at 1000 Hz and focused through a 50 cm focal