FUNCTIONAL GENOMIC STUDIES TO IDENTIFY LEAF RUST RESISTANCE RELATED GENES IN BREAD WHEAT

Abstract

This study was carried out at the Department of Genetics, Faculty of Agriculture, Ain Shams University, Shoubra El-khama, Egypt, the Plant Pathogen Interaction Lab (PPIL), Agricultural Genetic Engineering Research Institute (AGERI), Agricultural Research Center (ARC),Giza, Egypt, and Wheat Diseases Research Department (WDRD), Plant Pathology Research Institute (PPATHRI), Agricultural Research Center (ARC), Giza, Egypt, during the period from 2012 to 2016. Wheat leaf rust is caused by Puccinia triticina Eriks reduces the yield and quality of the grain and forage. Yield losses in wheat from leaf rust infections are usually the result of decreased number of kernels per head and lower kernel weight. It can cause yield loss between 20-50% if infection occurs very early and the disease continues to develop during the growing season in susceptible cultivars.