IDENTIFYING WORST-CASE TEST VECTORS FOR LEAKAGE CURRENT AND DELAY FAILURES INDUCED BY TOTAL DOSE IN CMOS ASICS
Mostafa Mahmoud Abd El-Aziz Mohamed;
Abstract
In this thesis, a new methodology for identifying WCTVs for delay failures
induced by total dose in ASICs and identifying WCTVs for leakage current induced by
total dose in sequential ASICs are developed. The importance of finding WCTVs is
protecting t
induced by total dose in ASICs and identifying WCTVs for leakage current induced by
total dose in sequential ASICs are developed. The importance of finding WCTVs is
protecting t
Other data
| Title | IDENTIFYING WORST-CASE TEST VECTORS FOR LEAKAGE CURRENT AND DELAY FAILURES INDUCED BY TOTAL DOSE IN CMOS ASICS | Other Titles | تحديد حالات الاختبارات التى تؤدى الى اسوأ تسريب فى التيار الكهربائى واخطاء التاخير للدوائر المتكامله التى تستخدم تكنولوجيا الCMOS ukعند تعرضها للاشعاع | Authors | Mostafa Mahmoud Abd El-Aziz Mohamed | Keywords | IDENTIFYING WORST-CASE TEST VECTORS FOR LEAKAGE CURRENT AND DELAY FAILURES INDUCED BY TOTAL DOSE IN CMOS ASICS | Issue Date | 2014 | Description | In this thesis, a new methodology for identifying WCTVs for delay failures induced by total dose in ASICs and identifying WCTVs for leakage current induced by total dose in sequential ASICs are developed. The importance of finding WCTVs is protecting t |
Attached Files
| File | Size | Format | |
|---|---|---|---|
| 124042R9819.pdf | 127.1 kB | Adobe PDF | View/Open |
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