Preparation and characterization of PbSSe nanomaterials for electronic and photovoltaic applications
Rasha Said Ibrahim Hegazy;
Abstract
• Lead sulphide and lead selenide powdered nanomaterials were prepared by three-neck hot injection method.
• The prepared powdered nanomaterials were identified by X-ray diffraction, EDAX and HRTEM study.
• PbS and PbSe quantum dot thin films of different thicknesses have been prepared by thermal evaporation technique.
• PbSxSe1-x (x ranges from 0 to 1) thin films were obtained by co-evaporation of PbS and PbSe from two sources, one of them is molybdenum boat containing PbS nanomaterials and the other boat contain PbSe nanomaterials.
• The effect of film thickness on The structural, optical, electrical, properties were investigated.
• The structural properties were studied through the XRD, EDAX and HRTEM study.
• From XRD study the lattice parameters, the particle size, the dislocation density and the microstrain were determined for PbS, PbSe and their ternary PbSxSe1-x films.
• From the TEM results, all the studied films consist of quantum dots as detects from their crystallite size.
• The effect of film thickness increase on all the structural parameters were studied as a function of composition for PbSxSe1-x films (x = 0 to 1.0).
• As the film thickness increases the particle size increases but the dislocation density and the microstrain decreases.
• The prepared powdered nanomaterials were identified by X-ray diffraction, EDAX and HRTEM study.
• PbS and PbSe quantum dot thin films of different thicknesses have been prepared by thermal evaporation technique.
• PbSxSe1-x (x ranges from 0 to 1) thin films were obtained by co-evaporation of PbS and PbSe from two sources, one of them is molybdenum boat containing PbS nanomaterials and the other boat contain PbSe nanomaterials.
• The effect of film thickness on The structural, optical, electrical, properties were investigated.
• The structural properties were studied through the XRD, EDAX and HRTEM study.
• From XRD study the lattice parameters, the particle size, the dislocation density and the microstrain were determined for PbS, PbSe and their ternary PbSxSe1-x films.
• From the TEM results, all the studied films consist of quantum dots as detects from their crystallite size.
• The effect of film thickness increase on all the structural parameters were studied as a function of composition for PbSxSe1-x films (x = 0 to 1.0).
• As the film thickness increases the particle size increases but the dislocation density and the microstrain decreases.
Other data
| Title | Preparation and characterization of PbSSe nanomaterials for electronic and photovoltaic applications | Authors | Rasha Said Ibrahim Hegazy | Issue Date | 2017 |
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