Optical spectroscopy and dispersion parameters of Ge15Se60X25(X = As or Sn) amorphous thin films
atyia, heba; Hegab, N.A.;
Abstract
In the present work the optical properties of Ge15Se60X25(X = As or Sn) films have been studied. Optical reflectance and transmittance of films were obtained at normal incident in the wavelength range (500-2500 nm). The transmittance measurements were used to calculate the refractive index n and the absorption index k depending on Swanepole's method. The analysis of the optical absorption data revealed that the optical band gap Egoptwas allowed indirect transitions. The optical constants such as complex dielectric constant, dispersion parameters (E0and Ed), ε∞, VELF, SELF and dissipation factor tan δ were determined. It was found that Egoptand the oscillator energy E0decreased with As addition than Sn addition. Whereas, the Urbach tail energy Ee, the dispersion energy Ed, the real and imaginary dielectric constants ε1and ε1, the high frequency dielectric constant ε∞and the dissipation factor tan δ increased with As addition than Sn addition. © 2013 EDP Sciences.
Other data
Title | Optical spectroscopy and dispersion parameters of Ge15Se60X25(X = As or Sn) amorphous thin films | Authors | atyia, heba ; Hegab, N.A. | Issue Date | 2013 | Journal | The European Physical Journal Applied Physics | DOI | 1 https://api.elsevier.com/content/abstract/scopus_id/84880113967 10301 63 10.1051/epjap/2013130099 |
Scopus ID | 2-s2.0-84880113967 |
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