Optimal Plans of Constant-Stress Accelerated Life Tests for Extension of the Exponential Distribution
Mohamed, Abd El-Raheem;
Abstract
In this article, the optimal plans for a k-level constant-stress accelerated life test are presented for extension of the exponential failure data under complete sampling. According to the log-linear life-stress relationship, the optimal proportion of test units allocated to each stress level is determined under D-and C-optimality criteria. Moreover, a real data set is analyzed to illustrate the proposed procedures. Furthermore, the real data set is used to show that extension of the exponential (EE) distribution can be a better model than both Weibull distribution and generalized exponential distribution. In addition, numerical examples are used to illustrate the proposed procedures and to compare between the D-optimal plan and C-optimal plan through asymptotic variance of maximum likelihood estimators. Finally, some interesting conclusions are obtained.
Other data
Title | Optimal Plans of Constant-Stress Accelerated Life Tests for Extension of the Exponential Distribution | Authors | Mohamed, Abd El-Raheem | Issue Date | 2019 | Publisher | ASTM International | Journal | Journal of Testing and Evaluation | DOI | https://doi.org/10.1520/JTE20170227 |
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