Determination of allowed transitions types and the optical parameters of Se–Ge–Ag chalcogenide films
Shakra, Amira M.; E. G. El-Metwally;
Abstract
Amorphous Se0:68Ge0:24Ag0:08 lms were prepared by the known thermal evaporation method.
X-ray di raction (XRD) and energy dispersive X-ray (EDX) analysis were used to identify the structure
of the prepared samples. Transmittance T( ) was measured at room temperature in the wave length range
(400{2500 nm) for the investigated lms of di erent thicknesses in range (221.2{815.2 nm). Swanepoel's
method was used to calculate the index of refraction n and absorption k. The allowed transitions in the
studied composition are indirect. Values of optical band gap Eopt
g were determined using two di erent
methods. The obtained values of Eopt
g are equal 1.90 and 1.91 eV, also the value of Urbach energy Ee equal
0.50 0.01 eV. Dispersion of refractive index n is analyzed using a single-oscillator model. The optical
high frequency dielectric constant "1 and the optical dispersion parameters (Eo and Ed) were calculated
by analyzing the obtained values of n. The obtained values of Eo, Ed and the average value of "1 are
found to be 5.36 eV, 18.86 eV and 4.60, respectively. The ratio N=m for the investigated composition is
3.87 1055 m3. The dependence of real "1 and imaginary "2 parts of dielectric constant, relaxation time
and the optical conductivity opt on photon energy h was also studied for Se0:68Ge0:24Ag0:08 lms. The
obtained results showed that "1, "2, and opt increased with photon energy.
X-ray di raction (XRD) and energy dispersive X-ray (EDX) analysis were used to identify the structure
of the prepared samples. Transmittance T( ) was measured at room temperature in the wave length range
(400{2500 nm) for the investigated lms of di erent thicknesses in range (221.2{815.2 nm). Swanepoel's
method was used to calculate the index of refraction n and absorption k. The allowed transitions in the
studied composition are indirect. Values of optical band gap Eopt
g were determined using two di erent
methods. The obtained values of Eopt
g are equal 1.90 and 1.91 eV, also the value of Urbach energy Ee equal
0.50 0.01 eV. Dispersion of refractive index n is analyzed using a single-oscillator model. The optical
high frequency dielectric constant "1 and the optical dispersion parameters (Eo and Ed) were calculated
by analyzing the obtained values of n. The obtained values of Eo, Ed and the average value of "1 are
found to be 5.36 eV, 18.86 eV and 4.60, respectively. The ratio N=m for the investigated composition is
3.87 1055 m3. The dependence of real "1 and imaginary "2 parts of dielectric constant, relaxation time
and the optical conductivity opt on photon energy h was also studied for Se0:68Ge0:24Ag0:08 lms. The
obtained results showed that "1, "2, and opt increased with photon energy.
Other data
Title | Determination of allowed transitions types and the optical parameters of Se–Ge–Ag chalcogenide films | Authors | Shakra, Amira M.; E. G. El-Metwally | Issue Date | 10-Oct-2018 | Publisher | Springer | Journal | The European Physical Journal B | Volume | 91 | Start page | 245 | ISSN | 1434-6028 1434-6036 |
DOI | 10.1140/epjb/e2018-90273-7 |
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