Kinetic Studies of Bulk Se70Ge30-xMx {X= 0.5 & M = Ag, Cd, Pb} Chalcogenide Semiconducting Glasses

S. A. Fayek; M. Fadel; E. G. El-Metwally;

Abstract


The thermal stability and crystallization of Se-Ge and Se-Ge-M alloys (M
= Cd, Ag, Pb) were studied by differential thermal analysis (DTA). A
comparison of various simple quantitative methods to assess the level of
stability of the glassy materials in the above mentioned system is presented.
All of these methods are based on characteristic temperatures, obtained by
heating of the samples in non-isothermal regime, such as the glass transition
temperature, Tg , the temperature at which crystallization begins, Tin , the
temperature corresponding to the maximum crystallization rate, Tp , and the
melting temperature, Tm. In this work the thermal stability has been evaluated
experimentally and correlated with the activation energies of glass transition
and crystallization by this kinetic criterion and compared with those evaluated
by other criteria.


Other data

Title Kinetic Studies of Bulk Se70Ge30-xMx {X= 0.5 & M = Ag, Cd, Pb} Chalcogenide Semiconducting Glasses
Authors S. A. Fayek; M. Fadel; E. G. El-Metwally 
Issue Date Nov-2007
Journal International Journal of Pure and Applied Physics 
Volume 3
Start page 109
End page 121

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