New interferometric method for determining the refractive index of thin dielectric film, its thickness, the phase shift, and the order of interference
Barakat, N.; El-Shazly, F. F. A.; ElShaer, Helmy;
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Title | New interferometric method for determining the refractive index of thin dielectric film, its thickness, the phase shift, and the order of interference | Authors | Barakat, N.; El-Shazly, F. F. A.; ElShaer, Helmy | Issue Date | Nov-1977 | Journal | Applied Physics | Volume | 14 | Issue | 3 | Start page | 319 | End page | 323 | ISSN | 0340-3793 1432-0630 |
DOI | 10.1007/BF00882738 |
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