Junction parameters and characterization of Au/n-Ge15In5Se80/p-Si/Al heterojunction

El-Nahass, M.M.; Ali, M. H.; E.A.A. El-Shazly; Zedan, I. T.;

Abstract


The analysis of the electrical properties of Au/n-Ge15In5Se80/p-Si/Al heterojunction is examined. I–V characteristics show diode-like behavior. The series resistance is found to decrease with increasing the temperature in three different methods of calculations. The thermionic emission mechanism is found to be the operating mechanism at relatively low forward voltages (V < 0.25). While, at relatively high forward voltage, the space charge limited conduction is the operating mechanism. The rectification ratio, ideality factor, barrier height, total trap concentration and built-in voltage are determined. The capacitance–voltage (C–V) characteristics of Au/n-Ge15In5Se80/p-Si/Al heterojunction are also investigated. The I–V curve of the Au/n-Ge15In5Se80/p-Si/Al heterojunction in the dark and after illumination is clarified.


Other data

Title Junction parameters and characterization of Au/n-Ge15In5Se80/p-Si/Al heterojunction
Authors El-Nahass, M.M. ; Ali, M. H.; E.A.A. El-Shazly ; Zedan, I. T.
Issue Date Aug-2016
Publisher Springer
Journal Applied Physics A 
Volume 122
ISSN 0947-8396
1432-0630
DOI 10.1007/s00339-016-0316-0

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