Electrical conduction and dielectric properties of lithium aluminum silicate glasses doped with Cr3+ ions

Abdel-Wahab, Fathy; Abdel Baki, M. H.;

Abstract


Amorphous lithium aluminum silicate glass system (LAS) implanted with chromium ions are prepared. The ac and dc conductivities (σac and σdc) of as-prepared bulk samples are measured under vacuum in the temperature range 373-153 K and displayed dielectric dispersion in the frequency range 50 Hz-80 kHz. The ac conductivity versus frequency plots were analyzed by considering a power law: σac ∝ ωs (s ≤ 1). A comparison between values of the index s with those numerically calculated from different conduction models reveals that correlated barrier hopping (CBH) is a fairly good model to describe the dominant ac conduction mechanism. The concept of the Meyer-Neldel (MN) rule in the expression of the relaxation time is considered for both ac and dc experimental data. The validity of the CBH model based on the MN (normal and inverted) rule is studied and discussed. Besides, results of the real dielectric constant (ε′), loss factor (ε″) and loss tangent (tan δ) together with the Cole-Cole diagrams and the optical (ε∞) and static (εs) dielectric constants for the studied samples are given and discussed. Crown Copyright © 2009.


Other data

Title Electrical conduction and dielectric properties of lithium aluminum silicate glasses doped with Cr3+ ions
Authors Abdel-Wahab, Fathy ; Abdel Baki, M. H. 
Keywords Transition metals;Electrical and electronic properties;Conductivity;Dielectric properties;relaxation;electric modulus;Oxide glasses;Silicates;Structure;Short-range order;MEYER-NELDEL RULE;AC CONDUCTION;HOPPING MODEL;CHALCOGENIDE;FREQUENCY;DC;RELAXATION;ABSORPTION;DISPERSION
Issue Date 2009
Publisher ELSEVIER
Journal JOURNAL OF NON-CRYSTALLINE SOLIDS 
Volume 355
Issue 45,47
Start page 2239
End page 2249
ISSN 0022-3093
DOI 10.1016/j.jnoncrysol.2009.07.028
Scopus ID 2-s2.0-70349337634
Web of science ID WOS:000271361300009

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