Accurate modeling of noise in switched-C ΔΣ analog-to-digital converters
Hegazi, Emad; Klemmer, Nikolaus;
Abstract
An accurate physical model of switched-capacitor ΔΣ analog-to-digital converters (ADCs) noise is presented. Noise artifacts for various ADC blocks are captured using simple equations. Model is verified against measured 0.25-μm high dynamic range ADC test chip for a wireless receiver. Design guidelines based on the proposed model are discussed. © 2005 IEEE.
Other data
| Title | Accurate modeling of noise in switched-C ΔΣ analog-to-digital converters | Authors | Hegazi, Emad ; Klemmer, Nikolaus | Keywords | Analog-to-digital converters (ADCs) | Delta Sigma | Noise | Switched capacitor | Issue Date | 1-Jan-2005 | Publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | Journal | IEEE Transactions on Circuits and Systems I: Regular Papers | ISSN | 10577122 | DOI | 10.1109/TCSI.2005.853948 | Scopus ID | 2-s2.0-28444472078 | Web of science ID | WOS:000233441400006 |
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