Aberration studies utilizing an opto-electronic coherent microscope
Hamed, Abdallah;
Other data
| Title | Aberration studies utilizing an opto-electronic coherent microscope | Authors | Hamed, Abdallah | Issue Date | Mar-1984 | Journal | Optik - International Journal for Light and Electron Optics | Volume | 67 | Issue | 3 | Start page | 279 | End page | 290 |
Attached Files
| File | Description | Size | Format | Existing users please Login |
|---|---|---|---|---|
| 7- optik 67 1984 279.pdf | 605.91 kB | Adobe PDF | Request a copy |
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