FAULT CLASSIFICATION IN ANALOG AND MIXED-SIGNAL CIRCUITS EIND PROTOTYPE METHODS
Mohamed Ibrahim ABD-ELHMEED WAFA;
Abstract
ABSTRACT
Fault detection and classification is currently a very important problem in industry. A single critical fault can lead to abnormal system performance, and often to complete system failure.
There are several approaches to solve this problem. In t
Fault detection and classification is currently a very important problem in industry. A single critical fault can lead to abnormal system performance, and often to complete system failure.
There are several approaches to solve this problem. In t
Other data
| Title | FAULT CLASSIFICATION IN ANALOG AND MIXED-SIGNAL CIRCUITS EIND PROTOTYPE METHODS | Authors | Mohamed Ibrahim ABD-ELHMEED WAFA | Keywords | FAULT CLASSIFICATION IN ANALOG AND MIXED-SIGNAL CIRCUITS EIND PROTOTYPE METHODS | Issue Date | 2008 | Description | ABSTRACT Fault detection and classification is currently a very important problem in industry. A single critical fault can lead to abnormal system performance, and often to complete system failure. There are several approaches to solve this problem. In t |
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