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Elnaeim, M. Abd
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Issue Date
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2015
Optical characterization of polycrystalline ZnSe1-xTex thin films using Variable Angle Spectroscopic Ellipsometry and Spectrophotmetery techniques
Shaaban, E. R.; El-Hagary, M.; Elnaeim, M. Abd; Moustafab, S. H.; Adel, A.; Mohamed Emam-Ismail
