Materials Science in Semiconductor Processing- 2015

View Statistics Email Alert RSS Feed

Name

Puplications
(All)

Results 1-1 of 1 (Search time: 0.0 seconds).

Refman EndNote Bibtex RefWorks Send via email

		Issue Date	Title	Author(s)
	1	2015	Optical characterization of polycrystalline ZnSe1-xTex thin films using Variable Angle Spectroscopic Ellipsometry and Spectrophotmetery techniques	Shaaban, E. R.; El-Hagary, M.; Elnaeim, M. Abd; Moustafab, S. H.; Adel, A.; Mohamed Emam-Ismail