New interferometric method for determining the refractive index of thin dielectric film, its thickness, the phase shift, and the order of interference

Barakat, N.; El-Shazly, F. F. A.; ElShaer, Helmy;

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Title New interferometric method for determining the refractive index of thin dielectric film, its thickness, the phase shift, and the order of interference
Authors Barakat, N.; El-Shazly, F. F. A.; ElShaer, Helmy 
Issue Date Nov-1977
Journal Applied Physics 
Volume 14
Issue 3
Start page 319
End page 323
ISSN 0340-3793
1432-0630
DOI 10.1007/BF00882738

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New interferometric method for determining the refractive index of thin dielectric film, its thickness, the phase shift, and the order of interference


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