Thickness and annealing effects on the optoelectronic properties of ZnS films
Mohamed,S.H; Mohamed Emam-Ismail; El-Hagary,M., M.;
Other data
| Title | Thickness and annealing effects on the optoelectronic properties of ZnS films | Authors | Mohamed,S.H; Mohamed Emam-Ismail ; El-Hagary,M., M. | Issue Date | 2010 | Publisher | Institute of Physics Publishing | Journal | Journal of Physics D: Applied Physics | Volume | 43 | Issue | (7) | Start page | art | End page | no |
Recommend this item
Similar Items from Core Recommender Database
Items in Ain Shams Scholar are protected by copyright, with all rights reserved, unless otherwise indicated.