Spectroscopic ellipsometry and morphological studies of nanocrystalline NiO and NiO/ITO thin films deposited by e-beams technique
El-Hagary, M.; El-Sherif, H.; El-Naggar, A.; El-Nahass, M. M.; Mohamed Emam-Ismail;
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| Title | Spectroscopic ellipsometry and morphological studies of nanocrystalline NiO and NiO/ITO thin films deposited by e-beams technique | Authors | El-Hagary, M.; El-Sherif, H.; El-Naggar, A.; El-Nahass, M. M.; Mohamed Emam-Ismail | Issue Date | 2021 | Publisher | Elsevier | Journal | Optical Materials | Volume | 112 | Start page | 110763 |
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