An adaptive heuristic algorithm for VLSI test vectors selection
Ibrahim, Walid; El-Chouemie, Amr; Amer, Hoda; Hesham El-Sayed;
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| Title | An adaptive heuristic algorithm for VLSI test vectors selection | Authors | Ibrahim, Walid; El-Chouemie, Amr; Amer, Hoda; Hesham El-Sayed | Issue Date | 2009 | Journal | European journal of operational research | Volume | 199 | Issue | 3 | Start page | 630 | End page | 639 |
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