Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem
Ibrahim, Walid; El-Chouemi, Amr; Hesham El-Sayed;
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| Title | Novel Heuristic and Genetic Algorithms for the VLSI Test Coverage Problem | Authors | Ibrahim, Walid; El-Chouemi, Amr; Hesham El-Sayed | Issue Date | 2006 | Start page | 402 | End page | 408 | Conference | IEEE International Conference on Computer Systems and Applications, 2006. |
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