Exploring conduction mechanisms in chalcogenide thin films: an experimental and soft computing approach with ANN and GP techniques
D. M. Habashy,; Ibrahem Mohamed, Hanem; H. E. Atyia,;
Abstract
The article consists of two main sections. In the first part, an experimental study was conducted to investigate the AC
conduction of Se83Bi17 (SB), Se83Bi17Ge5 (SBG), and Se83Bi17Te5 (SBT) in thin film forms. Thermal evaporation was utilized
to produce films with different thicknesses. The measurements were performed at temperatures ranging from 293 to 393K, film
thicknesses ranging from 230.2 to 543.9 nm, and frequencies ranging from 0.1 to 1000 kHz. The AC data were analyzed using the
frequency power law.
conduction of Se83Bi17 (SB), Se83Bi17Ge5 (SBG), and Se83Bi17Te5 (SBT) in thin film forms. Thermal evaporation was utilized
to produce films with different thicknesses. The measurements were performed at temperatures ranging from 293 to 393K, film
thicknesses ranging from 230.2 to 543.9 nm, and frequencies ranging from 0.1 to 1000 kHz. The AC data were analyzed using the
frequency power law.
Other data
| Title | Exploring conduction mechanisms in chalcogenide thin films: an experimental and soft computing approach with ANN and GP techniques | Authors | D. M. Habashy, ; Ibrahem Mohamed, Hanem ; H. E. Atyia, | Issue Date | 11-Sep-2023 | Journal | Eur. Phys. J. Plus (2023) | Volume | 138 | Start page | 798 | DOI | 10.1140/epjp/s13360-023-04382-7 |
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