Wave Reflection and Scattering Investigation from Semiconductor, Resistive Sheet, and Conductor Surfaces
Ibrahim Ibrahim Ali El-Abyad;
Abstract
The full field solution in a semiconductor medium based on charge transport model under small-signal analysis is presented to obtain the reflection coefficients for both H-polarization (parallel polarization) and E-polarization (perpendicular polarization
Other data
| Title | Wave Reflection and Scattering Investigation from Semiconductor, Resistive Sheet, and Conductor Surfaces | Authors | Ibrahim Ibrahim Ali El-Abyad | Keywords | Wave Reflection and Scattering Investigation from Semiconductor, Resistive Sheet, and Conductor Surfaces | Issue Date | 2008 | Description | The full field solution in a semiconductor medium based on charge transport model under small-signal analysis is presented to obtain the reflection coefficients for both H-polarization (parallel polarization) and E-polarization (perpendicular polarization |
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