Advanced Parameter Extraction Tool for Deep Submicron MOS Devices أداة متقدمة لإستخراج بارامترات نبائط MOS تحت الميكرونية العميقة
Dalia Selim Louis;
Abstract
The great advances in VLSI technology in recent years have been supported by the rapid development in the design, fabrication and modeling of MOSFET devices at the submicron level. Reduction in the transistor size continually complicates the device physic
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| Title | Advanced Parameter Extraction Tool for Deep Submicron MOS Devices أداة متقدمة لإستخراج بارامترات نبائط MOS تحت الميكرونية العميقة | Authors | Dalia Selim Louis | Keywords | Advanced Parameter Extraction Tool for Deep Submicron MOS Devices أداة متقدمة لإستخراج بارامترات نبائط MOS تحت الميكرونية العميقة | Issue Date | 2007 | Description | The great advances in VLSI technology in recent years have been supported by the rapid development in the design, fabrication and modeling of MOSFET devices at the submicron level. Reduction in the transistor size continually complicates the device physic |
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