Hardware Based Automatic Test Pattern Generation
Hany Ismail Kashif;
Abstract
VLSI design process usually starts with a top-level system design phase that
speci es the main blocks required to achieve the functional speci cations of
the product. These blocks are further decomposed into logic gates in the logic
design phase which
speci es the main blocks required to achieve the functional speci cations of
the product. These blocks are further decomposed into logic gates in the logic
design phase which
Other data
| Title | Hardware Based Automatic Test Pattern Generation | Other Titles | معجل لمولدات أنماط الإختبار في الدوائر العددية | Authors | Hany Ismail Kashif | Keywords | Hardware Based Automatic Test Pattern Generation | Issue Date | 2010 | Description | VLSI design process usually starts with a top-level system design phase that speci es the main blocks required to achieve the functional speci cations of the product. These blocks are further decomposed into logic gates in the logic design phase which |
Attached Files
| File | Size | Format | |
|---|---|---|---|
| 93600p245.pdf | 136.31 kB | Adobe PDF | View/Open |
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