Electrical conduction and dielectric relaxation in semiconductor SeSm0.005

Abdel-Wahab, Fathy; Kotkata, MF; Abdelmaksoud, Heba;

Abstract


The dc and ac conductivity of polycrystalline SeSm0.005 bulk samples have been measured under vacuum in the temperature range 363-93 K. The samples displayed dielectric dispersion in the frequency range 50 Hz-80 kHz. The calculated values of the exponent s of the function σ ≤ Aωs showed that correlated barrier hopping is the suitable model to describe the ac conduction mechanism. Calculation of the real dielectric constant (ε′), loss factor (ε″) and loss tangent (tan δ) are given in the studied frequency and temperature ranges. The loss factor displayed a loss peak that gives direct evidence of the existence of a Debye relaxation type. Also, the arc shape of Cole-Cole diagrams has been used to determine and discuss the optical (ε∞) and static (εs) dielectric constants besides the macroscopic relaxation (τ0) and molecular relaxation (τ) times.


Other data

Title Electrical conduction and dielectric relaxation in semiconductor SeSm0.005
Authors Abdel-Wahab, Fathy ; Kotkata, MF; Abdelmaksoud, Heba 
Keywords AC CONDUCTION;PHASE-PROPERTY;HOPPING MODEL;CHALCOGENIDE;FREQUENCY;FILMS;SELENIUM
Issue Date 2006
Publisher IOP PUBLISHING LTD
Journal Journal of Physics D: Applied Physics 
Volume 39
Issue 1
ISSN 0022-3727
DOI 10.1088/0022-3727/39/1/028
Scopus ID 2-s2.0-29144523178
Web of science ID WOS:000235411300029

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