A parallel technique for ATPG using genetic algorithms
Sabry, Mohamed-Nabil; Wahba, Ayman; Mahdi, Hani;
Abstract
This paper presents a new technique for test pattern generation based on a genetic algorithm and parallel processing techniques. This new method offers compact test sets, compared to other methods, that achieve maximum coverage.
Other data
| Title | A parallel technique for ATPG using genetic algorithms | Authors | Sabry, Mohamed-Nabil ; Wahba, Ayman ; Mahdi, Hani | Issue Date | 1-Jan-1998 | Conference | Proceedings of the 10th International Conference on Microelectronics, ICM 1998 | ISBN | [0780349695, 9780780349698] | DOI | 10.1109/ICM.1998.825571 | Scopus ID | 2-s2.0-85051870360 |
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